Additive Manufacturing Benchmarks 2022

August 14–18, 2022 • Hyatt Regency Bethesda • Bethesda, Maryland, USA

Additive Manufacturing Benchmarks (AM-Bench) provide a continuing series of controlled benchmark measurements, in conjunction with a conference series, with the primary goal of enabling modelers to test their simulations against rigorous, highly controlled additive manufacturing benchmark test data. All AM-Bench data are permanently archived for public use. The AM-Bench conference series provides a venue for sharing the results of these tests and convening modelers and experimentalists to discuss successes and challenges.

AM-Bench 2022 conference is the second event in the conference series, which is planned on a three-year cycle. The first AM-Bench conference was hosted by the National Institute of Standards and Technology (NIST) at its campus in Gaithersburg, Maryland in June 2018. The conference proceedings have been published in the TMS archival publication, Integrating Materials and Manufacturing Innovation.

Information on the Benchmark Challenges: The 2022 benchmark descriptions, challenge problems, and calibration data are published at www.nist.gov/ambench.

Thank You to Our Sponsors

Health and Safety

As of August 2, the Bethesda/Montgomery County COVID community level is high, which means that masks are strongly recommended and social distancing and other precautions should be taken. TMS staff members are required to wear masks at the conference. If the community level changes before or during the event, TMS staff will alert you.

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Conference Sponsors and Organizers

AM-Bench 2022 is sponsored by the TMS Additive Manufacturing Committee, Process Technology and Modeling Committee, and Integrated Computational Materials Engineering Committee, in collaboration with National Institute of Standards and Technology (NIST), the National Aeronautics and Space Administration (NASA) - Langley, the Air Force Research Laboratory (AFRL), and the Lawrence Livermore National Laboratory (LLNL).

Co-Chairs

• Brandon Lane, NIST
• Lyle Levine, NIST

Organizing Committee

• Edward Glaessgen, NASA
• Nikolas Hrabe, NIST
• Kalman Migler, NIST
• Shawn Moylan, NIST
• Thien Phan, LLNL
• Edwin Schwalbach, AFRL
• Jonathan Seppala, NIST
• Mark Stoudt, NIST

For More Information

For more information about this meeting, please complete the meeting inquiry form or contact: