Yttria-stabilized zirconia (YSZ) is one of the promising candidates for application in the inert matrix fuel. This letter presents the effects of fission product strontium incorporation in the YSZ microstructure. The strontium ions were implanted at room temperature to a dose of 1×1017 ions/cm2 and that was followed by subsequently annealing at 1000 °C for 1–3 h. Transmission electron microscopy (TEM) was utilized to characterize the microstructure evolution after the implantation and/or annealing. No amorphization was observed in the YSZ matrix with a damage level of 200 dpa (displacements per atom). The link provided leads to the abstract only. The full article may be purchased from the American Institute of Physics.

Citation: Zhu, S., Wang, S.X., Wang, L.M. Ewing, R.C., and Zu, X.T. "Behavior of Implanted Strontium in Yttria-Stabilized Zirconia." Applied Physics Letters. 90.171915 (April 2007).

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