JOM Table of Contents: September 1994

TABLE OF CONTENTS
Volume 46, Number 9-- September 1994

ABOUT THE COVER
As this issue covers, in part, the simulation of metal-forming processes, the cover provides an on-screen view of a solidification model. In the model, the various colors represent different temperatures. Among other things, such knowledge can be used to reduce processing costs and improve component reliability. The casting- and forging-oriented coverage begins on page 16. The photo comes to JOM courtesy of the Pechiney Group's Howmet Corporation.

Click on the cover to see a full-page reproduction

METAL FORMING

Commentary:
Cost-Effective Process Modeling: Are We There Yet? [p. 16]
Sulekh C. Jain

Overview:
A New Paradigm: The Investment Casting Cooperative Arrangement [pp. 17-20]
Boyd A. Mueller and Philip Monaghan

Overview:
Improving Manufacturing by Cost-Effective Process Modeling [pp. 21-23]
Hugo E. Delgado, Ramanath I. Ramakrishnan, and Timothy E. Howson

Applied Technology:
The Thermal Modeling of Large Axisymmetric Forgings [pp. 24-26]
C.J. Van Tyne, R.B. Focht, T.D. Nelson, and W. Reese

Design:
A Knowledge-Based Computer Tool for Casting Process Design [pp. 27-30]
Nihar K. Nanda, Karl A. Smith, Kenneth F. Haberle, and Vaughan R. Voller

TEXTURE ANALYSIS

Commentary:
Practical Applications in Texture Analysis [p. 31]
David B. Knorr and Hasso Weiland

Overview:
Applying Texture Analysis to Materials Engineering Problems [pp. 32-36]
D.B. Knorr, H. Weiland, and J.A. Szpunar

Applied Technology:
Microtexture Determination and Its Application to Materials Science [pp. 37-41]
Hasso Weiland

Overview:
Applications of Texture in Thin Films [pp. 42-48]
David B. Knorr and Jerzy A. Szpunar

SEMICONDUCTOR CHARACTERIZATION

Commentary:
The Characterization of Complex Heterostructure Materials [p. 49]
John M. Parsey, Jr.

Overview:
Characterizing III-V Heteroepitaxial Structures [pp. 50-54]
Raghaw S. Rat and Craig A. Parsons

Overview:
Analyzing Semiconductor Devices Using Modulation Spectroscopy [pp. 55-59]
Fred H. Pollak, H. Qiang, D. Yan, Yichun Yin, and W. Krystek

Overview:
Nondestructive Characterization of Semiconductor Multilayers [pp. 60-64]
Christopher Pickering

DEPARTMENTS

In the Final Analysis [p. 2]
News & Update [pp. 10-15]
Campus Notebook [pp. 70-71]
Material Matters: So You've Been Asked to Be an Expert Witness [p. 72]
Meetings Calendar [pp. ]
Consultants Directory [p. 78]
Classifieds [pp. 78-79]
Retrospect [p. 80]

ALSO IN THIS ISSUE

1994 TMS Annual Meeting Registration Form [p. 6]
1994 TMS Annual Meeting Housing Reservation Form [p. 7]
TMS News [pp. 65-68]
Division News: EMPMD [insert]
1994 Fall Technology Sale [insert]

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