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http://www.tms.org/pubs/journals/JOM/0010/Ravindra/Ravindra-0010.html
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Over the past two decades, research and development in sensors
has increased significantly, as demonstrated by the growth in financial investment
by the manufacturing sector, the number of papers published, and the number
of active researchers worldwide.
Sensor science and technology are growing rapidly in response to an ever-increasing
demand for faster, cheaper, smaller, and more sensitive means to monitor the
chemical, biological, and physical world around us. Sensors can have a global
impact in many areas such as environmental cleanup, industrial process control,
emission monitoring, aeronautical and space systems, planetary exploration,
nonproliferation of weapons, screening for explosives and contraband, home and
workplace safety, and medical diagnosis and care, just to name a few. Sensors
provide many of the functions of analytical instrumentation, but with reduced
cost, size, and power consumption, along with the ability for real-time, in-situ
measurements.
Optimization of industrial processes using computer control algorithms requires
real-time information of the various process parameters. The degree to which
a process can be optimized depends upon the quality and quantity of information
received, and this can be enhanced by development of efficient, advanced and
cost-effective sensors.
In this month’s JOM-e
supplement (the papers are exclusively on JOM’s
web site and not in the print version of the issue), we are pleased, on the
behalf of the TMS Electronic,
Magnetic & Photonic Materials Division, to present an exciting set of papers
focussing on the infinite capabilities and applications of a variety of sensors.
In doing so, the fundamental science and technology that form the foundation
of these new frontiers of science are not neglected.
The first article deals with the subject
of infrared analysis of thin film materials. Rosenthal,
Xu, Charpenay, Cosgrove, and Ravindra describe improvements in Fourier transform
infrared (FTIR) reflectometry used to characterize the thickness and optical
properties of thin films commonly employed in advanced integrated circuits (I.C.s).
As the semiconductor industry develops smaller, faster, more energy efficient
integrated circuits, specifications for layer composition and thickness are
changing radically. The authors explain how infrared spectroscopy provides two
additional ways to characterize films with complex chemistry. The first is a
high sensitivity optical reflectometer design that measures thin films while
suppressing reflected back lighting. The other is a model-based approach fitting
to extract dielectric function of a layer from the reflectance spectrum. The
authors found that these combined techniques can help FTIR enhance the development
and production of materials under consideration for a new generation of I.C.s.
Next up is an article from Ivanov
on advanced sensors for multifunctional applications. Sensor engineers today
face the challenge of developing advanced sensors for many functions similar
to human and animal senses. Since sensors rarely operate in an environment where
only one parameter is present, the sensors must be able to process effectively
and efficiently many stimuli such as temperature, pressure, and odor in much
the same way a human brain does. Employing multifunctional micro-electro-mechanical
sensor (MEMS) systems, the author explains how the combination of MEMS and thin
film technology can enable sensors to detect chemical, mechanical, and physical
parameters at the same time.
Cosandey,
Skandan, and Singhal focus on materials and processing issues in nanostructured
semiconductor gas sensors. The article explores advances in developing an electronic
“nose” capable of detecting mixed gases and even odors. Divided into three parts,
the article examines the selectivity and sensitivity of semiconductor oxides,
reviews synthesis methods for producing nanostructured thin-film semiconductor
oxide materials, and summarizes the challenges facing the implementation of
this new technology.
Kumar
studies piezoelectric crystal detectors and biosensors. The article describes
the construction of an antibody-based piezo-electric sensor that can detect
mycro-bacterial antigen in diluted cultures of M. tuberculosis. Such a sensor
could be used in agricultural and veterinary applications, along with industrial,
mining, explosives, pollution, and other areas. The advantages of this type
of sensor include fast response times, low costs, simplicity, minimum sample
pretreatments, and high sample throughtput.
Finally, Fergus
describes the use of chemical sensors in the control of molten metal during
processing (). Such sensors can provide valuable information about changes in
the composition of a molten alloy. Real-time information on these compositional
changes can be used to optimize the process for efficiency or product quality.
Chemical sensors can be used to improve control in the processing of such molten
metals as steel, aluminum, and zinc. In some cases, sensors are commercially
available and widely used. In others, the sensors are under development or are
too costly. In the course of the paper, the author reviews the status of sensor
development for some of these applications.
Using this 21st century superhighway called the Internet, we sincerely hope
that this electronic supplement will be of great use to the sensor community
in particular and the world of science in general. We thank all the contributors
for their hard work that has made this issue possible, and we acknowledge with
thanks the editorial assistance of Anand Shenoy, graduate student at the New
Jersey Institute of Technology.
Using this 21st century superhighway
called the Internet, we sincerely hope that this electronic supplement will
be of great use to the sensor community in particular and the world of science
in general. We thank all the contributors for their hard work that has made
this issue possible, and we acknowledge with thanks the editorial assistance
of Anand Shenoy, graduate student at the New
Jersey Institute of Technology.
Direct questions about this or any other JOM page to jom@tms.org.
If you would like to comment on the October
2000 issue of JOM,
simply complete the JOM on-line critique form |
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