JOURNAL OF ELECTRONIC MATERIALS
	TABLE OF CONTENTS Volume 26, Number 5, May 1997 This Month Featuring: Review Paper, Regular Issue Papers, and Letter. View May 1997 Abstracts.

REVIEW PAPER

REGULAR ISSUE PAPERS

Dry Etching of III-V Semiconductors in IBr/Ar Electron Cyclotron Resonance Plasmas [pp. 429-435]
J.W. Lee, J. Hong, E.S. Lambers, C.R. Abernathy, S.J. Pearton, W.S. Hobson, and F. Ren

Laser-Induced Direct Etching of GaAs Using Chlorofluorocarbon (CFC) Alternative Gases [pp. 436-439]
Moo-Sung Kim, Cheon Lee, Se Ki Park, Won Chel Choi, Eun Kyu Kim, Seong-Il Kim, Byoung Sung Ahn, and Suk-ki Min

Nearly Room-Temperature Type-II Quantum-Well Lasers at 3-4 µm [pp. 440-443]
Chih-Hsiang Lin, P.C. Chang, S.J. Murry, D. Zhang, Rui Q. Yang, S.S. Pei, J.I. Malin, J.R. Meyer, C.L. Felix, J.R. Lindle, L. Goldberg, C.A. Hoffman, and E.J. Bartoli

LPE Growth of Crack-Free PbSe Layers on Si(100) Using MBE-Grown PbSe/BaF₂CaF₂ Buffer Layers [pp. 444-448]
B.N. Strecker, P.J. McCann, X.M. Fang, R.J. Hauenstein, M. O'Steen, and M.B. Johnson

Structural, Electrical, and Optical Studies of GaAs Implanted with MeV As or Ga Ions [pp. 449-458]
J. Jasinski, Z. Liliental-Weber, J. Washburn, H.H. Tan, C. Jagadish, A. Krotkus, S. Marcinkevicius, and M. Kaminska

Chemical Composition and Thermal Stability of 2 Butyl, 5 Chloro, Benzimidazole Film [pp. 459-462]
V. Sirtori, L. Lombardi, and G. Redaelli

Defect Characterization of n-Type Si_1-xGe_x After 1.0 keV Helium-Ion Etching [pp. 463-469]
S.A. Goodman, F.D. Auret, K. Nauka, and J.B. Malherbe

Thermally Stimulated Current Measurements on a UV Irradiated Organic Photoreceptor Layer [pp. 470-473]
D.P. Webb, Y.C. Chan, C.K.H. Wong, Y.W. Lam, K.M. Leung, and D.S. Chiu

LETTER