JOURNAL OF ELECTRONIC MATERIALS
	TABLE OF CONTENTS Volume 25, Number 6, June 1996 This Month Featuring: Regular Issue Papers; Letters Section and an Editorial Announcement. View June 1996 Abstracts.

REGULAR ISSUE PAPERS

Magnetic Properties of Nickel Filament Polymer-Matrix Composites [pp. 930-934]
Xiaoping Shui and D.D.L. Chung

High-Performance, Transparent Conducting Oxides Based on Cadmium Stannate [pp. 935-943]
T.J. Coutts, X. Wu, W.P. Mulligan, and J.M. Webb

Highly Strained In_0.35Ga_0.65As/GaAs Layers Grown by Molecular Beam Epitaxy for High Hole Mobility Transistors [pp. 944-947]
Makoto Kudo, Tomoyoshi Mishima, Hidetoshi Matsumoto, Isao Ohbu, and Takuma Tanimoto

Molecular Beam Epitaxial Growth of Strained AlGaInAs Multi-Quantum Well Lasers on InP [pp. 948-954]
MJ. Mondry, E.J.Tarsa, and L.A. Coldren

In-situ Spectroscopic Reflectometry for Polycrystalline Silicon Thin Film Etch Rate Determination During Reactive Ion Etching [pp. 955-964]
Tyrone E. Benson, Leonard I. Kamlet, Peter Klimecky, and Fred L. Terry, Jr.

InP-Based Multiple Quantum Well Structures Grown with Tertiarybutylarsine (TBA) and Tertiarybutylphosphine (TBP): Effects of Growth Interruptions on Structural and Optical Properties [pp. 965-971]
A.L. Holmes, Jr., M.E. Heimbuch, G. Fish, L.A. Coldren, and S.P. DenBaars

Interfacial Properties of YBa₂Cu₃0_7-x Thin Films on Al₂0₃ Substrates Prepared by Pulsed Laser Deposition [pp. 972-975]
Sang Yeol Lee and Hyung-Ho Park

Thermomechanical Deformation of 1 µm Thick Cu-Polyimide Line Arrays Studied by Scanning Probe Microscopy [pp. 976-982]
D.V. Zhmurkin, T.S. Gross, L.P. Buchwalter, and F.B. Kaufman

Thermodynamic Assessments of the Sn-In and Sn-Bi Binary Systems [pp. 983-991]
Byeong-Joo Lee, Chang-Seok Oh, and Jae-Hyeok Shim

A Numerical Method for Predicting Intermetallic Layer Thickness Developed During the Formation of Solder Joints [pp. 992-1003]
Mathew Schaefer, Werner Laub, Janet M. Sabee, Raymond A. Fournelle, and Ping S. Lee

A Study of Parasitic Reactions Between NH₃ and TMGa or TMAl [pp. 1004-1008]
C.H. Chen, H. Liu, D. Steigerwald, W. Imler, C.P. Kuo, M.G. Craford, M. Ludowise, S. Lester, and J. Amano

Influence of Ga vs As Prelayers on GaAs/Ge Growth Morphology [pp. 1009-1013]
Q. Xu, J.W.P. Hsu, E.A. Fitzgerald, J.M. Kuo, Y.H. Xie, and P.J. Silverman

N-Type Hg_1-xCd_xTe: Undoped x=0.3 LPE Material for SPRITE IR Detectors [pp. 1014-1018]
A. McAllister, E.S. O'Keefe, P. Capper, F.A. Capocci, S. Barton, and D.T. Dutton

LETTERS SECTION

EDITORIAL ANNOUNCEMENT